A variety of automatic test systems for test applications are described by W.G. Fee in Tutoriala LSI Testing, second edition, IEEE ... Self-Test Services, Maple Glenn , Pa. ... in electrical engineering from the Indian Institute of Technology in Kanpur, and the Ph.D. in electrical engineering from the University of Illinois in Urbana.
|Title||:||Tutorial test generation for VLSI chips|
|Author||:||Vishwani D. Agrawal, Sharad C. Seth, IEEE Computer Society|
|Publisher||:||IEEE Computer Society - 1988|