ITC is the World's largest premier technical conference on the testing and total quality of integrated electronics and the assenblies and systems that are based on them.of the FAULT_LIST type array with the same identifier are considered as a single fault by the fault simulator. the ... model or system representation level obtained through the stages of analysis and elaboration of the VHDL code defined in the VHDL LRM. ... This model can be defined both at the VHDL axle level anbsp;...
|Title||:||Proceedings, International Test Conference 1996|
|Publisher||:||Conference - 1996-01-01|