This book gathers together comprehensive information which test and process professionals will find invaluable. The techniques outlined will help ensure that test methods and data collected reflect actual device performance, rather than 'testing the tester' or being lost in the noise floor. This book addresses the fundamental issues underlying the semiconductor test discipline. The test engineer must understand the basic principles of semiconductor fabrication and process and have an in-depth knowledge of circuit functions, instrumentation and noise sources. Introduces a novel component-testing philosophy for semiconductor test, product and design engineers. Best new source of information for experienced semiconductor engineers as well as entry-level personnel. Eight chapters about semiconductor testing.References 1. Comer, J., Modern Electronic Circuit Design, Addison-Wesley, 1976. 2. ... Millman, Jacob, and Christos C. Halkias, Integrated Electronics: Analog and Digital Circuits and Systems, McGraw-Hill, 1972. . Lenk, John ... Boylestad, Myles H., and Luis Nashelsky, Electronicsaa Survey, Prentice Hall, 1978. . Scarlettanbsp;...
|Title||:||Principles of Semiconductor Network Testing|
|Publisher||:||Elsevier - 1996-04-22|