Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.An Approach for Dealing with Testability Problems in VLSI-Based Design, a Proc. ... and P.K. Lala, aSelf-Checking Combinational Circuit Design for Single and Unidirectional Multibit Errors.a JETTA, No. ... Combinational Circuits with Special Fault-Handling Capabilities, a 13th IEEE Test Symposium, Princeton, N.J., 1995, pp.
|Title||:||On-Line Testing for VLSI|
|Author||:||Michael Nicolaidis, Yervant Zorian, Dhiraj Pradhan|
|Publisher||:||Springer Science & Business Media - 2013-03-09|