Noncontact Atomic Force Microscopy

Noncontact Atomic Force Microscopy

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Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with the following outstanding recent results obtained with atomic resolution since then: force spectroscopy and mapping with atomic resolution; tuning fork; atomic manipulation; magnetic exchange force microscopy; atomic and molecular imaging in liquids; and other new technologies. These results and technologies are now helping evolve NC-AFM toward practical tools for characterization and manipulation of individual atoms/molecules and nanostructures with atomic/subatomic resolution. Therefore, the book exemplifies how NC-AFM has become a crucial tool for the expanding fields of nanoscience and nanotechnology.Seizo Morita, Franz J. Giessibl, Roland Wiesendanger ... Y. Sugimoto, P. Pou, M. Abe, P. Jelinek, R. Perez, S. Morita, O. Custance, Nature 446, 1287 (2007) 4. F.J. Giessibl, Rev. Mod. Phys. 75, 957 ... Rev. Lett. 98, 106104 (2007) 8. S. Hirth, F. ... E-PRLTAO-98-020702 for the manual and further information. 13. J. Melcheranbsp;...

Title:Noncontact Atomic Force Microscopy
Author:Seizo Morita, Franz J. Giessibl, Roland Wiesendanger
Publisher:Springer Science & Business Media - 2009-09-18


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