This is an introduction to noise, describing fundamental noise sources and basic circuit analysis, discussing characterization of low-frequency noise and offering practical advice that bridges concepts of noise theory and modelling, characterization, CMOS technology and circuits. The text offers the latest research, reviewing the most recent publications and conference presentations. The book concludes with an introduction to noise in analog/RF circuits and describes how low-frequency noise can affect these circuits.Our presentation includes nanometer scaled devices, strained Si, SiGe, SOI, high -k gate dielectrics, metal gates and ... In appendix III a short solution manual is provided. A reader of this book is assumed to understand fundamental semiconductor physics as well as the principles of CMOS devices at an undergraduate level.
|Title||:||Low-Frequency Noise in Advanced MOS Devices|
|Author||:||Martin von Haartman, Mikael Östling|
|Publisher||:||Springer Science & Business Media - 2007-08-23|