IEEE VLSI Test Symposium

IEEE VLSI Test Symposium

4.11 - 1251 ratings - Source

circuit dependent. 11. ... References [I] Akers, S.B., Binary Decision Diagrams, IEEE Transactions on Computers, Vol. ... Decision Diagram Size when representing classes of Symmetric Functions, Journal of Electronic Testing: Theory and Applications (JETTA), Vol. ... 97-104, . [10] Ross D. E., M. R. Mercer, Calculating Logic Functions Via Ordered Partial Multi-Decision Diagrams, Personal Communication.

Title:IEEE VLSI Test Symposium
Publisher: - 1993


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