This useful book addresses electrothermal problems in modern VLSI systems. It discusses electrothermal phenomena and the fundamental building blocks that electrothermal simulation requires. The authors present three important applications of VLSI electrothermal analysis: temperature-dependent electromigration diagnosis, cell-level thermal placement, and temperature-driven power and timing analysis.Once the matrix is solved and the dc solution is found at time t, as illustrated in Fig. 1.3, the transient solution of the temperature and the node voltage can be found by utilizing the preferred integration formula. ... The relaxation method is more efficient, but convergence problems can occur under Some biasing conditions.
|Title||:||Electrothermal Analysis of VLSI Systems|
|Author||:||Yi-Kan Cheng, Ching-Han Tsai, Chin-Chi Teng, Sung-Mo (Steve) Kang|
|Publisher||:||Springer Science & Business Media - 2007-05-08|