This new edition includes new material on angle resolved XPS, surface engineering and complimentary methods. The text considers the two most popular techniques: X-ray photoelectron spectrosopy and Auger electron spectroscopy.The book will also be a useful reference to those newcomers to surface science wishing to familiarise themselves with the necessary techniques.
|Title||:||An Introduction to Surface Analysis by XPS and AES|
|Author||:||John F. Watts, John Wolstenholme|
|Publisher||:||John Wiley and Sons - 2003-05-23|