Alvin Lun-Knep Jee, F. Joel Ferguson. undetected by the stuck-at test sets. In the worst case, where none of the channel-to-row or the cell-to-cell WCA is covered, 20% of the total WCA in the circuit ... On average, most of the shorts from the wiring channel to the cell rows will be detected by the stuck- at tests since the shortsanbsp;...
|Title||:||An Analysis of Shorts in CMOS Standard Cell Circuits|
|Author||:||Alvin Lun-Knep Jee, F. Joel Ferguson|