This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. qHotq topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.To match in this situation, the designer can capture the data from the tester, input it into the schematic tool (including the ... Circuit C TLIN TL5 E=120 Z=50.0 Ohm Term Term10 Z=200-j*100 Num=10 CC5 C=1.84 pF L L4 R=L=19.4 nH Term9anbsp;...
|Title||:||Advances in Electronic Testing|
|Publisher||:||Springer Science & Business Media - 2006-01-22|